Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal's Advanced Transmission Electron Microscopy: Applications to PDF

By Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal

ISBN-10: 3319151762

ISBN-13: 9783319151762

ISBN-10: 3319151770

ISBN-13: 9783319151779

This booklet highlights the present realizing of fabrics within the context of latest and continually rising innovations within the box of electron microscopy. The authors current functions of electron microscopic recommendations in characterizing a number of recognized & new nanomaterials. The purposes defined contain either inorganic nanomaterials in addition to natural nanomaterials.

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Extra info for Advanced Transmission Electron Microscopy: Applications to Nanomaterials

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Egerton, Control of radiation damage in the TEM. Ultramicroscopy 127, 100–108 (2013) 44. M. Azubel, J. Koivisto, S. Malola, D. L. L. Koh, H.  Häkkinen, Electron microscopy of gold nanoparticles at atomic resolution. Science 345, 909–912 (2014) 45. G. Tang, L. R. S. Mann, W. Jiang, I. J. Ludtke, EMAN2: an extensible image processing suite for electron microscopy. J. Struct. Biol. 157, 38–46 (2007) 46. D. Bahena, N. Bhattarai, U. Santiago, A. Tlahuice, A. B. Bach, B. L. Whetten, U. Landman, M. Jose-Yacaman, STEM electron diffraction and high-resolution images used in the determination of the crystal structure of the Au144(SR)60 cluster.

8 shows the electron diffraction patterns of three different spot numbers; in the image no clear effect on the convergence angle can be observed. 9 shows the graph for the results of varying the spot number and their effect on the convergence angle; these results indicate a slight decrement on the convergence angle as the spot number decreases, which means a displacement of the crossover of the electron beam closer to the C2 lens. The main effect of varying the spot number was observed on the intensity of the electron beam; the smaller the spot number, the higher the intensity of the electron beam; this had a major impact at the time of recording the diffraction pattern on the CCD camera, because very 2 Electron Diffraction and Crystal Orientation… 41 Fig.

In a modern TEM with a FEG tip, a small probe of around 1–2 nm size (Fig. 17b) can be formed in NBD mode by using a small condenser aperture; this will yield a high spatial resolution of the map. If the sample is thick, however, the trade-off of selecting the smallest spot size and aperture is to preserve enough brightness in the diffraction pattern. When using precession, the effective focused beam size on the specimen will suffer from beam broadening due to spherical aberration for the nonaxial trajectories, and this will be more noticeable when increasing the precession angle [26].

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Advanced Transmission Electron Microscopy: Applications to Nanomaterials by Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal

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